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Dear Colleagues,

We would like to draw your attention to a session on microanalytical 
techniques that will be part of Mineralogy Symposium (MPM) at the 
forthcoming International Geological Congress in Oslo 6-14 August 
2008 (www.33igc.org). The session entitled

MPM-12 New developments in microbeam techniques will be convened by 
John Hanchar, Martin Whitehouse and myself.

We believe that this exciting topic will attract researchers, experts 
and students from various fields of Earth and material science and 
give us the opportunity to discuss recent achievements and problems 
of in-situ measurements.
Please note that the abstract deadline for the IGC in Oslo is 
February 29, 2008. Feel free to contact us if you have any questions.

We hope to see you in Oslo this summer.

Jan Kosler, John Hanchar and Martin Whitehouse

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MPM-12 New developments in microbeam techniques. Session (Jan Kosler, 
John Hanchar, Martin Whitehouse)

Recent advancements in microanalytical techniques, including SIMS, 
laser ablation ICP-MS, laser assisted gas source mass spectrometry, 
electron and x-ray microbeam analysis, have opened new possibilities 
to study elemental and isotopic variations with previously unmatched 
spatial resolution, detection capabilities and analytical precision. 
Contributions are sought both in analytical technique development and 
new applications of microbeam analysis, including elemental 
concentration measurements, analysis of radiogenic and stable 
isotopes and use of microbeam techniques for studying spatial 
variations in chemical and isotopic composition of geological and 
environmental materials.

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Jan Kosler ([log in to unmask])
Department of Earth Science, University of Bergen
Allegaten 41, N-5007 Bergen, Norway
phone: +47-555-83409 (office), 82628 (lab), fax: +47-555-83660